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White Papers and Application Notes
Simple Finite Element Model of the Topografiner
Published in 2014
In our recent experiments we are revisiting the topografiner technology for the imaging of surface topography with a resolution of a few nanometers. In these new technique called Near-Field Emission Scanning Electron Microscopy (NFESEM), low-energy electrons are emitted from a polycrystalline tungsten tip via electric-field assisted tunneling. In order to characterize and improve the capabilities of our microscopes, in particular the vertical and lateral resolutions, we simulate the tunnel junction consisting of a metallic tip placed at distance d from a planar electrode and consider current versus voltage (I-V) and voltage versus distance (V-d) measurements.
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- cabrera_poster.pdf - 0.45MB
- cabrera_paper.pdf - 0.52MB
- cabrera_abstract.pdf - 0.46MB